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Journal: Crystals, 2019
Volume: 9
Number: 232

Article: In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation
Authors: by Michael Kerber, Florian Spieckermann, Roman Schuster, Bertalan Joni, Norbert Schell and Erhard Schafler
Link: https://www.mdpi.com/2073-4352/9/5/232

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