Stan, C.V.; O’Bannon, E.F., III; Mukhin, P.; Tamura, N.; Dobrzhinetskaya, L.
X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite. Minerals 2020, 10, 204.
https://doi.org/10.3390/min10030204
AMA Style
Stan CV, O’Bannon EF III, Mukhin P, Tamura N, Dobrzhinetskaya L.
X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite. Minerals. 2020; 10(3):204.
https://doi.org/10.3390/min10030204
Chicago/Turabian Style
Stan, Camelia Veronica, Earl Francis O’Bannon, III, Pavel Mukhin, Nobumichi Tamura, and Larissa Dobrzhinetskaya.
2020. "X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite" Minerals 10, no. 3: 204.
https://doi.org/10.3390/min10030204
APA Style
Stan, C. V., O’Bannon, E. F., III, Mukhin, P., Tamura, N., & Dobrzhinetskaya, L.
(2020). X-ray Laue Microdiffraction and Raman Spectroscopic Investigation of Natural Silicon and Moissanite. Minerals, 10(3), 204.
https://doi.org/10.3390/min10030204