Chen, Y.; Wen, J.; Tian, Y.; Zheng, S.; Zhong, Q.; Chai, X.
Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian. Appl. Sci. 2023, 13, 10711.
https://doi.org/10.3390/app131910711
AMA Style
Chen Y, Wen J, Tian Y, Zheng S, Zhong Q, Chai X.
Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian. Applied Sciences. 2023; 13(19):10711.
https://doi.org/10.3390/app131910711
Chicago/Turabian Style
Chen, Yafeng, Jing Wen, Yingjie Tian, Shubin Zheng, Qianwen Zhong, and Xiaodong Chai.
2023. "Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian" Applied Sciences 13, no. 19: 10711.
https://doi.org/10.3390/app131910711
APA Style
Chen, Y., Wen, J., Tian, Y., Zheng, S., Zhong, Q., & Chai, X.
(2023). Dynamic Reliability Assessment Method for a Pantograph System Based on a Multistate T-S Fault Tree, Dynamic Bayesian. Applied Sciences, 13(19), 10711.
https://doi.org/10.3390/app131910711