Verspeek, S.; De Kerf, T.; Ribbens, B.; Maldague, X.; Vanlanduit, S.; Steenackers, G.
A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements. Appl. Sci. 2024, 14, 235.
https://doi.org/10.3390/app14010235
AMA Style
Verspeek S, De Kerf T, Ribbens B, Maldague X, Vanlanduit S, Steenackers G.
A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements. Applied Sciences. 2024; 14(1):235.
https://doi.org/10.3390/app14010235
Chicago/Turabian Style
Verspeek, Simon, Thomas De Kerf, Bart Ribbens, Xavier Maldague, Steve Vanlanduit, and Gunther Steenackers.
2024. "A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements" Applied Sciences 14, no. 1: 235.
https://doi.org/10.3390/app14010235
APA Style
Verspeek, S., De Kerf, T., Ribbens, B., Maldague, X., Vanlanduit, S., & Steenackers, G.
(2024). A Novel Line-Scan Algorithm for Unsynchronised Dynamic Measurements. Applied Sciences, 14(1), 235.
https://doi.org/10.3390/app14010235