Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling
Abstract
:1. Introduction
2. Materials and Methods
2.1. Membrane Preparation
- (i)
- Asymmetric etching (i.e., one-side etching protocol) of the irradiated foils, performed consecutively, was applied to study the gradual development of pores under both isochronal and isothermal conditions. Different pore shapes were obtained for different etching temperatures and exposure times. For the etching procedure, a 9M NaOH solution was used in a temperature range of 55–75 C and etching times 0–60 min. For subsequent doping, 5M LiCl solution was selected as a dopant, and doping was carried out for 24 h at RT only from the side of etching at different stages of the pore development. After removing the sample from the dopant vessel, the sample surface was gently dried and cleaned from the excess dopant solution by wiping a smooth cloth over the sample surface.
- (ii)
- In addition to one-side etching (performed in NPI Řež), a double-side etching protocol was also applied (JINR Dubna). Symmetric etching procedures made it possible to create membranes with cylindrical pores of several different diameters of 7 µm, 2.4 µm, and 0.53 µm (see Figure 1). Doping with boron was performed on only one side of the membrane (in addition to the PET films, a Si wafer was also used for the comparative analysis). Boron (99.9%, Kurt J. Lesker) was sputtered in Ar under a pressure of 5 Pa using a 3-inch planar magnetron powered by a radio frequency (13.56 MHz) power source. The power gradually increased (from 20 to 80 W) to avoid a thermal shock and cracking of the target. The total time of the deposition was 30 min, with a set thickness of 40 nm. Before deposition, the surface of the B target was pre-sputtered (cleaned) for 20 min.
2.2. Analytical Method
3. Results
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Data Availability Statement
Conflicts of Interest
References
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Ceccio, G.; Vacik, J.; Siegel, J.; Cannavó, A.; Choukourov, A.; Pleskunov, P.; Tosca, M.; Fink, D. Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling. Membranes 2022, 12, 1061. https://doi.org/10.3390/membranes12111061
Ceccio G, Vacik J, Siegel J, Cannavó A, Choukourov A, Pleskunov P, Tosca M, Fink D. Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling. Membranes. 2022; 12(11):1061. https://doi.org/10.3390/membranes12111061
Chicago/Turabian StyleCeccio, Giovanni, Jiri Vacik, Jakub Siegel, Antonino Cannavó, Andrey Choukourov, Pavel Pleskunov, Marco Tosca, and Dietmar Fink. 2022. "Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling" Membranes 12, no. 11: 1061. https://doi.org/10.3390/membranes12111061
APA StyleCeccio, G., Vacik, J., Siegel, J., Cannavó, A., Choukourov, A., Pleskunov, P., Tosca, M., & Fink, D. (2022). Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling. Membranes, 12(11), 1061. https://doi.org/10.3390/membranes12111061