Article Versions Notes

Roldán JB, González-Cordero G, Picos R, Miranda E, Palumbo F, Jiménez-Molinos F, Moreno E, Maldonado D, Baldomá SB, Moner Al Chawa M, et al. On the Thermal Models for Resistive Random Access Memory Circuit Simulation. Nanomaterials. 2021; 11(5):1261. https://doi.org/10.3390/nano11051261

Roldán, Juan B., Gerardo González-Cordero, Rodrigo Picos, Enrique Miranda, Félix Palumbo, Francisco Jiménez-Molinos, Enrique Moreno, David Maldonado, Santiago B. Baldomá, Mohamad Moner Al Chawa, and et al. 2021. "On the Thermal Models for Resistive Random Access Memory Circuit Simulation" Nanomaterials 11, no. 5: 1261. https://doi.org/10.3390/nano11051261

Roldán, J. B., González-Cordero, G., Picos, R., Miranda, E., Palumbo, F., Jiménez-Molinos, F., Moreno, E., Maldonado, D., Baldomá, S. B., Moner Al Chawa, M., de Benito, C., Stavrinides, S. G., Suñé, J., & Chua, L. O. (2021). On the Thermal Models for Resistive Random Access Memory Circuit Simulation. Nanomaterials, 11(5), 1261. https://doi.org/10.3390/nano11051261