Mulder, L.; Wielens, D.H.; Birkhölzer, Y.A.; Brinkman, A.; Concepción, O.
Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates. Nanomaterials 2022, 12, 1790.
https://doi.org/10.3390/nano12111790
AMA Style
Mulder L, Wielens DH, Birkhölzer YA, Brinkman A, Concepción O.
Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates. Nanomaterials. 2022; 12(11):1790.
https://doi.org/10.3390/nano12111790
Chicago/Turabian Style
Mulder, Liesbeth, Daan H. Wielens, Yorick A. Birkhölzer, Alexander Brinkman, and Omar Concepción.
2022. "Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates" Nanomaterials 12, no. 11: 1790.
https://doi.org/10.3390/nano12111790
APA Style
Mulder, L., Wielens, D. H., Birkhölzer, Y. A., Brinkman, A., & Concepción, O.
(2022). Revisiting the van der Waals Epitaxy in the Case of (Bi0.4Sb0.6)2Te3 Thin Films on Dissimilar Substrates. Nanomaterials, 12(11), 1790.
https://doi.org/10.3390/nano12111790