Shang, H.; Sun, D.; Yu, P.; Wang, B.; Yu, T.; Li, T.; Jiang, H.
Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy. Coatings 2020, 10, 236.
https://doi.org/10.3390/coatings10030236
AMA Style
Shang H, Sun D, Yu P, Wang B, Yu T, Li T, Jiang H.
Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy. Coatings. 2020; 10(3):236.
https://doi.org/10.3390/coatings10030236
Chicago/Turabian Style
Shang, Hongpeng, Degui Sun, Peng Yu, Bin Wang, Ting Yu, Tiancheng Li, and Huilin Jiang.
2020. "Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy" Coatings 10, no. 3: 236.
https://doi.org/10.3390/coatings10030236
APA Style
Shang, H., Sun, D., Yu, P., Wang, B., Yu, T., Li, T., & Jiang, H.
(2020). Investigation for Sidewall Roughness Caused Optical Scattering Loss of Silicon-on-Insulator Waveguides with Confocal Laser Scanning Microscopy. Coatings, 10(3), 236.
https://doi.org/10.3390/coatings10030236