Yang, H.; Lian, S.; Chapon, P.; Song, Y.; Wang, J.; Xu, C.
Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers. Coatings 2021, 11, 612.
https://doi.org/10.3390/coatings11060612
AMA Style
Yang H, Lian S, Chapon P, Song Y, Wang J, Xu C.
Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers. Coatings. 2021; 11(6):612.
https://doi.org/10.3390/coatings11060612
Chicago/Turabian Style
Yang, Hao, Songyou Lian, Patrick Chapon, Yibing Song, Jiangyong Wang, and Congkang Xu.
2021. "Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers" Coatings 11, no. 6: 612.
https://doi.org/10.3390/coatings11060612
APA Style
Yang, H., Lian, S., Chapon, P., Song, Y., Wang, J., & Xu, C.
(2021). Quantification of High Resolution Pulsed RF GDOES Depth Profiles for Mo/B4C/Si Nano-Multilayers. Coatings, 11(6), 612.
https://doi.org/10.3390/coatings11060612