Wang, Z.; Jeon, S.-H.; Hwang, Y.-J.; Lee, S.-H.; Jang, J.; Kang, I.M.; Kim, D.-K.; Bae, J.-H.
Physico-Chemical Origins of Electrical Characteristics and Instabilities in Solution-Processed ZnSnO Thin-Film Transistors. Coatings 2022, 12, 1534.
https://doi.org/10.3390/coatings12101534
AMA Style
Wang Z, Jeon S-H, Hwang Y-J, Lee S-H, Jang J, Kang IM, Kim D-K, Bae J-H.
Physico-Chemical Origins of Electrical Characteristics and Instabilities in Solution-Processed ZnSnO Thin-Film Transistors. Coatings. 2022; 12(10):1534.
https://doi.org/10.3390/coatings12101534
Chicago/Turabian Style
Wang, Ziyuan, Sang-Hwa Jeon, Yu-Jin Hwang, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim, and Jin-Hyuk Bae.
2022. "Physico-Chemical Origins of Electrical Characteristics and Instabilities in Solution-Processed ZnSnO Thin-Film Transistors" Coatings 12, no. 10: 1534.
https://doi.org/10.3390/coatings12101534
APA Style
Wang, Z., Jeon, S. -H., Hwang, Y. -J., Lee, S. -H., Jang, J., Kang, I. M., Kim, D. -K., & Bae, J. -H.
(2022). Physico-Chemical Origins of Electrical Characteristics and Instabilities in Solution-Processed ZnSnO Thin-Film Transistors. Coatings, 12(10), 1534.
https://doi.org/10.3390/coatings12101534