Vacuum Ultraviolet Spectroscopic Analysis of Structural Phases in TiO2 Sol–Gel Thin Films
Abstract
:1. Introduction
2. Materials and Methods
2.1. Preparation and Characterization of TiO2 Thin Films
- Sol Preparation: A 0.2 M solution of titanium (IV) isopropoxide (TTIP, Ti(i-OPr)4, 97%, Aldrich, Darmstadt, Germany) was prepared by dissolving it in ethanol (EtOH, 99.9%, Fisher Scientific, Porto Salvo, Portugal). Acetylacetone (AcAc, 99%, Fisher Scientific) was added as a chelating agent in a 1:1 molar ratio with TTIP to stabilize the titanium alkoxide. Deionized water and glacial acetic acid (CH3CO2H, 1 M) were added dropwise under continuous stirring. The solution was then stirred under reflux at 75 °C for approximately 12 h to ensure proper reaction and stabilization. After cooling to room temperature, a few drops of distilled water were added dropwise under vigorous stirring to facilitate the hydrolysis of the titanium precursor. The solution was stirred for 2 h at room temperature until a clear, light-yellow homogeneous sol was obtained.
- Film Deposition: The TiO2 films (thickness~200 nm) were deposited on Si wafers using a single cycle of spin-coating at 500 rpm for 15 s with a Laurell WS-400-6NPP-LITE spin coater (Laurell Technologies Corporation, USA). Si wafers were used for FTIR and XPS analyses. The sol was also deposited onto calcium fluoride (CaF2) substrates (1 mm thick) using the same spin-coating technique. CaF2 substrates were chosen for VUV analysis. The substrates were spun with the gel solution at a controlled rate to achieve a uniform film thickness of approximately 500 nm. The spinning parameters, including acceleration and duration, were optimized to ensure the desired thickness and homogeneity of the films.
- Drying and Annealing: The coated substrates were dried at 120 °C for 1 h to remove excess solvent. The films were then annealed at various temperatures (400 °C, 600 °C, and 800 °C) for 6 h each to promote different levels of crystallization.
- Characterization: The structural and morphological properties of the TiO2 films were characterized using X-ray diffraction (XRD) with a Siemens D-5000 diffractometer and CuKα radiation. The diffracted intensity was measured over a 2θ range from 22° to 35°, which includes the main diffraction peaks for both the anatase and rutile phases, specifically at 25.3° (101) for anatase and 27.4° (110) for rutile. The step size used was 0.02°. FTIR spectra were recorded in transmission mode with a resolution of 2 cm−1, using a Nicolet iS5 FTIR spectrometer (Thermo Scientific, Waltham, MA, USA), specifically to analyze the OH vibrations in the range of 4000–2000 cm−1. The spectra were averaged from 100 scans at room temperature. XPS measurements were conducted on an ESCALAB 250 spectrometer with dual aluminum–magnesium anodes and monochromatic Al Kα radiation (hν = 1486.6 eV). The procedure followed was as described in [5], with an energy resolution of 0.1 eV for the Ti 2p spectra, including the spin-orbit split components (2p3/2 and 2p1/2), and for the O 1s spectrum.
2.2. VUV Photoabsorption Measurements
3. Results and Discussion
3.1. TiO2 Film Evolution
3.2. XRD Analysis
3.3. VUV Analysis
3.3.1. Observed Electronic Transitions
- High-energy charge-transfer transitions (~125–150 nm): These involve electron excitation from the bonding (σ) orbitals of the O(2p) states to the antibonding (π*) orbitals in the Ti(3d) conduction band (σ → π*). These transitions require relatively higher energy due to the excitation of electrons to a higher unoccupied state, resulting in broader absorption features in the spectra.
- Lower-energy charge-transfer transitions (~160–200 nm): These transitions involve electron excitation from the π-bonding orbitals (primarily in the O(2p) states) to the antibonding π* orbitals in the Ti(3d) conduction band (π → π*). These transitions are typically characterized by sharper peaks, indicative of lower-energy electronic transitions compared to the high-energy σ → π* transitions.
3.3.2. Temperature-Induced Variations in Absorbance
3.3.3. Temperature-Induced Phase Evolution
3.3.4. Defect Creation and Phase Transition in TiO2
3.3.5. Linking Defects and Quantum Confinement Effects
3.3.6. Hybridization of Conduction Band States
3.4. FTIR and VUV Spectra Analysis of TiO2 Films
Apparent Contradiction Between FTIR and VUV
3.5. XPS and VUV Spectra Analysis of TiO2 Films
3.5.1. XPS Analysis
3.5.2. Cause–Effect Analysis: Defects in XPS and VUV Spectra
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Aspect | Am (Red) | A (Blue) | A + R (Green) | R (Purple) |
---|---|---|---|---|
Absorption characteristics | Minimal orbital hybridization, broad disordered states dominate. | Ti t2g(π) → t*2g (π*); moderate eg(σ) contributions. | Anatase t2g → t*2g and rutile eg(σ) → t*2g, enhanced overlap of π → π*. | Strong eg(σ) → t*2g (π*) and t2g(π) → t*2g (π*) due to symmetry and smaller Δ. |
Transition at ~280 nm | Broad charge-transfer transition O(2p) → Ti3d(t2g). | Strong O(2p) → Ti(3d) charge-transfer due to high Δ. | Enhanced O(2p) → Ti3d(t2g); rutile overlaps increase intensity. | O(2p) → Ti3d(t2g) dominates; smaller Δ enhances electronic delocalization, increasing the transition intensity. |
Transition at ~175–180 nm | Diffuse σ → π* or charge transfer O(2p) → Ti3d(eg) | Moderate eg(σ) → t*2g(π*); overlaps with charge-transfer transitions. | Mixed contributions: anatase-like eg(σ) → t*2g, and rutile-like charge-transfer O(2p) → Ti(3d) states enhance intensity. | Dominated by eg(σ) → t*2g; intense due to higher symmetry and smaller bandgap (~3.0 eV). |
Shoulder at ~145 nm | Weak or absent; no sharp π → π* transitions due to amorphous structure. | Moderate π → π*: t2g(π) → t*2g(π*). | Strong shoulder: dual contributions from anatase π → π* and rutile’s σ → π*. | Most intense π → π*: t2g(π) → t*2g(π*), combined with σ → π* transitions from eg. |
Bandgap-related effects | Broad, featureless absorption, defect and localized states dominate. | Crystal field splitting Δ (~3.2 eV) shapes sharper absorption features. | Intermediate Δ due to mixed phases: slightly broader features compared to anatase, sharper than amorphous. | Smallest Δ (~3.0 eV), strongest and sharpest features from well-ordered orbital overlap. |
Phase | Transition Type | Orbital Interaction | Energy (eV) | Wavelength (nm) | Key Notes |
---|---|---|---|---|---|
Amorphous | σ → σ* | Ti(3d) (σ-bonding) → O(2p) (σ*-antibonding | >9.9 | <125 | Broad absorption due to high disorder; localized defect states. |
Anatase | σ → π* | O(2p) (σ-bonding) → Ti(3d) (π*-antibonding) | ~9.0–9.4 | ~125–138 | Stronger in anatase due to distortion in TiO6 octahedra. |
Anatase | π → π* | O(2p) (π-bonding) → Ti(3d) (π*-antibonding) | ~6.2–7.0 | ~176–200 | Sharp peaks at 176 nm; indicative of crystallinity and an increase in defect density. |
Rutile | σ → σ* | Ti(3d) (σ-bonding) → O(2p) (σ*-antibonding) | ~8.5 | ~146 | Less pronounced due to symmetric lattice structure. |
Rutile | π → π* | O(2p) (π-bonding) → Ti(3d) (π*-antibonding) | ~6.6–6.8 | ~182–190 | Broader peaks due to less distortion compared to anatase. |
Mixed phases | Interfacial states | Defect-mediated transitions | ~5.8–6.5 | ~190–215 | Resulting from oxygen vacancies or anatase–rutile grain boundary effects. |
Quantum confinement | π → π* | O(2p) (π-bonding) → Ti(3d) (π*-antibonding) | >7.5 | <165 | Observed in nanoscale TiO2 grains; absorption edge blue shifted. |
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Vasconcelos, H.C.; Meirelles, M.; Özmenteş, R.; Korkut, A. Vacuum Ultraviolet Spectroscopic Analysis of Structural Phases in TiO2 Sol–Gel Thin Films. Coatings 2025, 15, 19. https://doi.org/10.3390/coatings15010019
Vasconcelos HC, Meirelles M, Özmenteş R, Korkut A. Vacuum Ultraviolet Spectroscopic Analysis of Structural Phases in TiO2 Sol–Gel Thin Films. Coatings. 2025; 15(1):19. https://doi.org/10.3390/coatings15010019
Chicago/Turabian StyleVasconcelos, Helena Cristina, Maria Meirelles, Reşit Özmenteş, and Abdulkadir Korkut. 2025. "Vacuum Ultraviolet Spectroscopic Analysis of Structural Phases in TiO2 Sol–Gel Thin Films" Coatings 15, no. 1: 19. https://doi.org/10.3390/coatings15010019
APA StyleVasconcelos, H. C., Meirelles, M., Özmenteş, R., & Korkut, A. (2025). Vacuum Ultraviolet Spectroscopic Analysis of Structural Phases in TiO2 Sol–Gel Thin Films. Coatings, 15(1), 19. https://doi.org/10.3390/coatings15010019