Efficient Binarized Convolutional Layers for Visual Inspection Applications on Resource-Limited FPGAs and ASICs
Abstract
:1. Introduction
Related Work
2. Background
2.1. Binarized Neural Networks
2.1.1. Binarization of Weights
2.1.2. Binarization of Activations
2.1.3. Performance and Improvements
2.2. Jet Features
2.2.1. Definition of Jet Features
2.2.2. Efficient Calculation
2.2.3. Multiscale Local Jets
2.2.4. The ECO Jet Features Algorithm
3. Neural Jet Features
3.1. Constrained Neural Jet Features
3.2. Computational Efficiency
4. Results
4.1. Model Architecture
4.2. BYU Fish Dataset
4.3. BYU Cookie Dataset
4.4. MNIST Dataset
4.5. Comparison and Discussion
5. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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Dataset | Conv. Filters | Fully Connected Units |
---|---|---|
BYU Fish | 8 | 16 |
BYU Cookie | 8 | 8 |
MNIST | 16 | 32 |
MNIST | 32 | 128 |
MNIST | 64 | 256 |
Dataset | Normal Binary Conv. | Unconstrained Jet Conv. | Constrained Jet Conv. |
---|---|---|---|
BYU Fish | 99.8% | 95% | 99.8% |
BYU Cookie | 95% | 77.5% | 96% |
MNIST 16 Filters | 93% | 92% | 92% |
MNIST 32 Filters | 92% | 97% | 97% |
MNIST 64 filters | 99% | 98% | 98% |
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Simons, T.; Lee, D.-J. Efficient Binarized Convolutional Layers for Visual Inspection Applications on Resource-Limited FPGAs and ASICs. Electronics 2021, 10, 1511. https://doi.org/10.3390/electronics10131511
Simons T, Lee D-J. Efficient Binarized Convolutional Layers for Visual Inspection Applications on Resource-Limited FPGAs and ASICs. Electronics. 2021; 10(13):1511. https://doi.org/10.3390/electronics10131511
Chicago/Turabian StyleSimons, Taylor, and Dah-Jye Lee. 2021. "Efficient Binarized Convolutional Layers for Visual Inspection Applications on Resource-Limited FPGAs and ASICs" Electronics 10, no. 13: 1511. https://doi.org/10.3390/electronics10131511
APA StyleSimons, T., & Lee, D. -J. (2021). Efficient Binarized Convolutional Layers for Visual Inspection Applications on Resource-Limited FPGAs and ASICs. Electronics, 10(13), 1511. https://doi.org/10.3390/electronics10131511