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Journal: Electronics, 2021
Volume: 10
Number: 2095

Article: Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis
Authors: by Omid Alavi, Leander Van Cappellen, Ward De Ceuninck and Michaël Daenen
Link: https://www.mdpi.com/2079-9292/10/17/2095

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