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Journal: Electronics, 2021
Volume: 10
Number: 2745

Article: In-Place Characterization of On-State Voltage for SiC MOSFETs: Controlled Shoot-Through vs. Film Heater
Authors: by Alessandro Soldati, Matteo Dalboni, Roberto Menozzi and Carlo Concari
Link: https://www.mdpi.com/2079-9292/10/22/2745

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