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Journal: Electronics, 2021
Volume: 10
Number: 2745
Article:
In-Place Characterization of On-State Voltage for SiC MOSFETs: Controlled Shoot-Through vs. Film Heater
Authors:
by
Alessandro Soldati, Matteo Dalboni, Roberto Menozzi and Carlo Concari
Link:
https://www.mdpi.com/2079-9292/10/22/2745
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