Sun, Y.; Li, Z.; He, Z.; Chi, Y.
Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts. Electronics 2021, 10, 3017.
https://doi.org/10.3390/electronics10233017
AMA Style
Sun Y, Li Z, He Z, Chi Y.
Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts. Electronics. 2021; 10(23):3017.
https://doi.org/10.3390/electronics10233017
Chicago/Turabian Style
Sun, Yi, Zhi Li, Ze He, and Yaqing Chi.
2021. "Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts" Electronics 10, no. 23: 3017.
https://doi.org/10.3390/electronics10233017
APA Style
Sun, Y., Li, Z., He, Z., & Chi, Y.
(2021). Design, Application, and Verification of the Novel SEU Tolerant Abacus-Type Layouts. Electronics, 10(23), 3017.
https://doi.org/10.3390/electronics10233017