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Journal: Electronics, 2022
Volume: 11
Number: 260

Article: P1OVD: Patch-Based 1-Day Out-of-Bounds Vulnerabilities Detection Tool for Downstream Binaries
Authors: by Hongyi Li, Daojing He, Xiaogang Zhu and Sammy Chan
Link: https://www.mdpi.com/2079-9292/11/2/260

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