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Journal: Electronics, 2022
Volume: 11
Number: 260
Article:
P1OVD: Patch-Based 1-Day Out-of-Bounds Vulnerabilities Detection Tool for Downstream Binaries
Authors:
by
Hongyi Li, Daojing He, Xiaogang Zhu and Sammy Chan
Link:
https://www.mdpi.com/2079-9292/11/2/260
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