Liu, Y.; Wu, W.; Li, J.; Zhao, M.; Wei, F.; Ren, S.; Huang, T.
Magnetic Field Testing Technique of System-Generated Electromagnetic Pulse Based on Magnetoresistance Effects. Electronics 2023, 12, 492.
https://doi.org/10.3390/electronics12030492
AMA Style
Liu Y, Wu W, Li J, Zhao M, Wei F, Ren S, Huang T.
Magnetic Field Testing Technique of System-Generated Electromagnetic Pulse Based on Magnetoresistance Effects. Electronics. 2023; 12(3):492.
https://doi.org/10.3390/electronics12030492
Chicago/Turabian Style
Liu, Yifei, Wei Wu, Jinxi Li, Mo Zhao, Feng Wei, Shuqing Ren, and Tao Huang.
2023. "Magnetic Field Testing Technique of System-Generated Electromagnetic Pulse Based on Magnetoresistance Effects" Electronics 12, no. 3: 492.
https://doi.org/10.3390/electronics12030492
APA Style
Liu, Y., Wu, W., Li, J., Zhao, M., Wei, F., Ren, S., & Huang, T.
(2023). Magnetic Field Testing Technique of System-Generated Electromagnetic Pulse Based on Magnetoresistance Effects. Electronics, 12(3), 492.
https://doi.org/10.3390/electronics12030492