Li, X.; Cui, J.; Zheng, Q.; Li, P.; Cui, X.; Li, Y.; Guo, Q.
Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices. Electronics 2023, 12, 1403.
https://doi.org/10.3390/electronics12061403
AMA Style
Li X, Cui J, Zheng Q, Li P, Cui X, Li Y, Guo Q.
Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices. Electronics. 2023; 12(6):1403.
https://doi.org/10.3390/electronics12061403
Chicago/Turabian Style
Li, Xiao, Jiangwei Cui, Qiwen Zheng, Pengwei Li, Xu Cui, Yudong Li, and Qi Guo.
2023. "Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices" Electronics 12, no. 6: 1403.
https://doi.org/10.3390/electronics12061403
APA Style
Li, X., Cui, J., Zheng, Q., Li, P., Cui, X., Li, Y., & Guo, Q.
(2023). Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices. Electronics, 12(6), 1403.
https://doi.org/10.3390/electronics12061403