Zhang, C.; Huang, Y.; Zhou, D.; Dong, Z.; He, S.; Zhou, Z.
A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics 2024, 13, 3618.
https://doi.org/10.3390/electronics13183618
AMA Style
Zhang C, Huang Y, Zhou D, Dong Z, He S, Zhou Z.
A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics. 2024; 13(18):3618.
https://doi.org/10.3390/electronics13183618
Chicago/Turabian Style
Zhang, Chao, Yiyang Huang, Dingyu Zhou, Zhijie Dong, Shilie He, and Zhenwei Zhou.
2024. "A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System" Electronics 13, no. 18: 3618.
https://doi.org/10.3390/electronics13183618
APA Style
Zhang, C., Huang, Y., Zhou, D., Dong, Z., He, S., & Zhou, Z.
(2024). A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System. Electronics, 13(18), 3618.
https://doi.org/10.3390/electronics13183618