Next Article in Journal
Robust Estimation of Lithium Battery State of Charge with Random Missing Current Measurement Data
Previous Article in Journal
Physical Layer Security in RIS-NOMA-Assisted IoV Systems with Uncertain RIS Deployment
Previous Article in Special Issue
CFE-YOLOv8s: Improved YOLOv8s for Steel Surface Defect Detection
 
 
Article

Article Versions Notes

Electronics 2024, 13(22), 4438; https://doi.org/10.3390/electronics13224438
Action Date Notes Link
article pdf uploaded. 12 November 2024 15:25 CET Version of Record https://www.mdpi.com/2079-9292/13/22/4438/pdf-vor
article xml file uploaded 13 November 2024 06:09 CET Original file -
article xml uploaded. 13 November 2024 06:09 CET Update https://www.mdpi.com/2079-9292/13/22/4438/xml
article pdf uploaded. 13 November 2024 06:09 CET Updated version of record https://www.mdpi.com/2079-9292/13/22/4438/pdf
article html file updated 13 November 2024 06:10 CET Original file https://www.mdpi.com/2079-9292/13/22/4438/html
Back to TopTop