Next Article in Journal
FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs
Next Article in Special Issue
Integration of Semantic and Topological Structural Similarity Comparison for Entity Alignment without Pre-Training
Previous Article in Journal
Thermal Safety Assessment Method for Power Devices in Natural Air-Cooled Converters
Previous Article in Special Issue
Design and Development of Knowledge Graph for Industrial Chain Based on Deep Learning
 
 
Article

Article Versions Notes

Electronics 2024, 13(9), 1666; https://doi.org/10.3390/electronics13091666
Action Date Notes Link
article pdf uploaded. 25 April 2024 17:45 CEST Version of Record https://www.mdpi.com/2079-9292/13/9/1666/pdf-vor
article xml file uploaded 30 April 2024 07:59 CEST Original file -
article xml uploaded. 30 April 2024 07:59 CEST Update https://www.mdpi.com/2079-9292/13/9/1666/xml
article pdf uploaded. 30 April 2024 07:59 CEST Updated version of record https://www.mdpi.com/2079-9292/13/9/1666/pdf
article html file updated 30 April 2024 08:00 CEST Original file https://www.mdpi.com/2079-9292/13/9/1666/html
Back to TopTop