Lian, X.; Shen, X.; Fu, J.; Gao, Z.; Wan, X.; Liu, X.; Hu, E.; Xu, J.; Tong, Y.
Electrical Properties and Biological Synaptic Simulation of Ag/MXene/SiO2/Pt RRAM Devices. Electronics 2020, 9, 2098.
https://doi.org/10.3390/electronics9122098
AMA Style
Lian X, Shen X, Fu J, Gao Z, Wan X, Liu X, Hu E, Xu J, Tong Y.
Electrical Properties and Biological Synaptic Simulation of Ag/MXene/SiO2/Pt RRAM Devices. Electronics. 2020; 9(12):2098.
https://doi.org/10.3390/electronics9122098
Chicago/Turabian Style
Lian, Xiaojuan, Xinyi Shen, Jinke Fu, Zhixuan Gao, Xiang Wan, Xiaoyan Liu, Ertao Hu, Jianguang Xu, and Yi Tong.
2020. "Electrical Properties and Biological Synaptic Simulation of Ag/MXene/SiO2/Pt RRAM Devices" Electronics 9, no. 12: 2098.
https://doi.org/10.3390/electronics9122098
APA Style
Lian, X., Shen, X., Fu, J., Gao, Z., Wan, X., Liu, X., Hu, E., Xu, J., & Tong, Y.
(2020). Electrical Properties and Biological Synaptic Simulation of Ag/MXene/SiO2/Pt RRAM Devices. Electronics, 9(12), 2098.
https://doi.org/10.3390/electronics9122098