Mayet, A.M.; Ijyas, V.P.T.; Bhutto, J.K.; Guerrero, J.W.G.; Shukla, N.K.; Eftekhari-Zadeh, E.; Alhashim, H.H.
Using Ant Colony Optimization as a Method for Selecting Features to Improve the Accuracy of Measuring the Thickness of Scale in an Intelligent Control System. Processes 2023, 11, 1621.
https://doi.org/10.3390/pr11061621
AMA Style
Mayet AM, Ijyas VPT, Bhutto JK, Guerrero JWG, Shukla NK, Eftekhari-Zadeh E, Alhashim HH.
Using Ant Colony Optimization as a Method for Selecting Features to Improve the Accuracy of Measuring the Thickness of Scale in an Intelligent Control System. Processes. 2023; 11(6):1621.
https://doi.org/10.3390/pr11061621
Chicago/Turabian Style
Mayet, Abdulilah Mohammad, V. P. Thafasal Ijyas, Javed Khan Bhutto, John William Grimaldo Guerrero, Neeraj Kumar Shukla, Ehsan Eftekhari-Zadeh, and Hala H. Alhashim.
2023. "Using Ant Colony Optimization as a Method for Selecting Features to Improve the Accuracy of Measuring the Thickness of Scale in an Intelligent Control System" Processes 11, no. 6: 1621.
https://doi.org/10.3390/pr11061621
APA Style
Mayet, A. M., Ijyas, V. P. T., Bhutto, J. K., Guerrero, J. W. G., Shukla, N. K., Eftekhari-Zadeh, E., & Alhashim, H. H.
(2023). Using Ant Colony Optimization as a Method for Selecting Features to Improve the Accuracy of Measuring the Thickness of Scale in an Intelligent Control System. Processes, 11(6), 1621.
https://doi.org/10.3390/pr11061621
