Benalcázar-Jalkh, E.B.; de Carvalho, L.F.; Alves, L.M.M.; Campos, T.M.B.; Sousa, E.d.O.; Bergamo, E.T.P.; Coelho, P.G.; Gierthmuehlen, P.C.; Spitznagel, F.A.; Zahoui, A.;
et al. Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems. Dent. J. 2023, 11, 207.
https://doi.org/10.3390/dj11090207
AMA Style
Benalcázar-Jalkh EB, de Carvalho LF, Alves LMM, Campos TMB, Sousa EdO, Bergamo ETP, Coelho PG, Gierthmuehlen PC, Spitznagel FA, Zahoui A,
et al. Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems. Dentistry Journal. 2023; 11(9):207.
https://doi.org/10.3390/dj11090207
Chicago/Turabian Style
Benalcázar-Jalkh, Ernesto B., Laura F. de Carvalho, Larissa M. M. Alves, Tiago M. B. Campos, Edisa de Oliveira Sousa, Edmara T. P. Bergamo, Paulo G. Coelho, Petra C. Gierthmuehlen, Frank A. Spitznagel, Abbas Zahoui,
and et al. 2023. "Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems" Dentistry Journal 11, no. 9: 207.
https://doi.org/10.3390/dj11090207
APA Style
Benalcázar-Jalkh, E. B., de Carvalho, L. F., Alves, L. M. M., Campos, T. M. B., Sousa, E. d. O., Bergamo, E. T. P., Coelho, P. G., Gierthmuehlen, P. C., Spitznagel, F. A., Zahoui, A., & Bonfante, E. A.
(2023). Reliability and Failure Mode of Ti-Base Abutments Supported by Narrow/Wide Implant Systems. Dentistry Journal, 11(9), 207.
https://doi.org/10.3390/dj11090207
