To evaluate this darkening, a microscopic reflectance measurement system was developed, presented below.
2.1. Multispectral-Imaging Microscope
In order to characterize the spectral reflectances of halftone prints at the microscopic scale, a custom multispectral imaging microscope was developed. The hardware, described in [
23], is composed of a microscope, colored optical filters mounted on a wheel, and a commercial digital camera. The camera captures an RGB image through each optical filter of a wheel. The filters are of small wavelength bandwidth, which allows to reconstruct the multispectral reflectance of the sample for various wavelengths. The scheme of the setup is displayed in
Figure 3.
The setup is composed of a microscope Zeiss Axio Imager M1 m mounted with the objective EC Epiplan Neofluar 5×/0.13 HD DIC. The light source is a Zeiss HAL 100 tungsten-halogen lamp set at 3200 K; it was turned on at least 20 minutes before the experiments to reach the steady state. Its emission spectrum is stronger for large wavelengths than for small wavelengths. To remove the specular reflections on the sample, a polarizer and an analyzer are used in a crossed configuration inside the microscope. A luxmeter, Yocto-Light-V3 LIGHTMK3 from Yoctopuce, is inserted across the path of the incident light beam in order to calibrate the irradiance of the sample for each image capture. The photodiode, manufactured by Rhoms (reference BH1751FVI), can measure in the range of 0 to 100,000 lux with a resolution of 0.25 lux. The camera is a commercial reflex camera, Canon 1200D with a RGGB CMOS sensor. The ISO was set to 800. The sensor, coded in 14 bits, has a resolution of 3516 × 5344 pixels. The camera is remotely monitored by a computer through a Python program. The filterwheel is composed of 17 filters (Hard Coated OD 4.0 25 nm Bandpass Filters from Edmund Optics) and driven by a motor. The camera captures at least one picture per filter with an adapted exposure time. The central wavelengths of the filters are in the range [400; 800 nm] with a 25 nm step. The filters have a 25 nm bandwidth. In practice, 13 filters are used in the range [400; 700 nm] corresponding to the spectral bandwidth of the light source.
To retrieve the spatial and spectral reflectances of a sample from the pixel values obtained through the camera, the apparatus is calibrated as follows. One pixel value is related to reflectance through [
24,
25,
26,
27]:
where
V is the pixel value associated with one optical filter,
T is the exposure time (it has been verified that
V is linear with
T),
e is proportional to the irradiance on the sample, measured with the photodiode,
E is the spectral power distribution of the light source,
F is the spectral transmittance of the filter,
B is the spectral transmittance of the bayer filter,
s is the spectral response of the sensor,
R is the reflectance of the sample associated with the considered pixel,
λ is the wavelength, and
Vk is a constant corresponding to the pixel value in the dark.
T is monitored by the computer and can be retrieved in the metadata of the pictures.
E,
F,
B, and
s are intrinsic to the device and complex to measure as they can depend on the spatial position of the pixel. If
R is constant within the spectral bandwidth of the filter, Equation (1) becomes:
where
and
R(λ′) is the reflectance of the sample at the central wavelength of the filter,
λ′. To calibrate the system,
Vk and
Q need to be determined.
During the calibration process, the value of each pixel of the camera in the dark, Vk, was determined once forever by capturing pictures in the dark for each exposure times. The results, for each exposure time, were averaged over 9 measurements and were used afterward to calibrate all measurements. The average pixel value in the dark was 2047 ± 11.
The measurement of
Q was made for each series of measurement through the capture of an opal glass spectralon (Commission of the European communities, community bureau of reference BCR, reference material number 406, individual identification number 0004) [
28].
Q was derived, for each filter:
where
Rc is the spectral reflectance of the opal glass spectralon at the central wavelength of the considered filter. This reflectance was determined through a measurement with a spectrophotometer, CM-2600d from Konica Minolta, with a di:8° geometry, including a UV cutoff filter, and an aperture of 8 mm diameter. It was measured 10 times and showed negligible uncertainties. For one filter, the reflectance at the central wavelength,
Rc, was the average reflectance over the 25 nm bandpass of the filter. The specular component of this spectrophotometric measurement (which is not included in the microscopic measurement) was removed by subtracting 0.04 to
Rc. The entire process was repeated four times and the final
Q value is the average of the four computed
Q values.
At this point, the apparatus is calibrated. The reflectance of any sample can then be determined from its pixel value
V:
As the response of the microscope was low for certain pixels of the bayer matrix according to the studied wavelength (for instance red bayer filter coupled with a blue optical filter), one pixel of the Bayer matrix was selected for each considered filter of the filterwheel, dividing the resolution of the pictures by 2 in each dimension. Moreover, the non-imaging part of the sensor was cropped. In the end, the reflectance pictures were 1728 × 2592 pixels, with an imaging resolution of 1.386 µm per pixel. Sensor saturation was prevented thanks to high dynamic range measurements (HDR) where images were captured twice with different exposure times. The accepted pixel value range, once Vk removed, was [100; 12,000], out of a range of approximately [0; 14,000]. Pixels still out of this range after the HDR recombination were discarded from the calculations, as well as all reflectance above 1. In practice, in all calculations, they were considered as Not a Number (NaN), except when displayed in pictures where they were set equal to 1 to outline them, and in convolution operations where they were set equal to the average spectral and spatial reflectance of the sample. During experiments, NaNs were largely avoided and showed negligible impacts on the results.
Using the spectrophotometer in the calibration process enables to compare the microscopic measurements from the custom apparatus (of resolution 1.386 µm per pixel) with the macroscopic ones from the spectrophotometer (measuring on an area of 8 mm diameter). Various halftone colors were designed and printed according to the protocol detailed in the
Section 2.3, and their reflectances were captured with the two systems. The average spectra of the images were calculated and compared with the spectrophotometric measurements, displayed in
Figure 4. A contribution of 0.04 was added to all reflectances which were measured with the microscope to account for the specular reflection included in the spectrophotometric measurement [
29]. The results showed a good agreement between the two measuring methods. The color difference between spectrophotometric and microscopic measurement was calculated with the
determined with the 2° observer, illuminant D65, and a perfect reflector as white reference. It is in average equal to
unit, which shows the uncommonly good agreement between the spectrophotometric and the microscopic measurements, in particular as they have different measurement geometries. Detailed performances are displayed in Table in
Section 3.
Small fluctuations in the reflectance measurements with the microscope were observed, but we were unable to fully understand their origin. They can be due to optical aberrations, light source fluctuations, camera sensor temperature variations, imprecisions in the filter positions, or mispositioned ambient light shield. Yet the microscale/macroscale agreement is usually hard to reach, and the results obtained with this setup are particularly compliant in this regard.
2.2. Optical Model
The objective is to be able to predict the reflectance of halftones when they are overlaid with a smooth transparent coating layer. An optical model has been developed and explained in [
9,
13,
14]. It is based on the simulation of light propagation within air, coating layer, ink, and paper. It is adapted here to microscopic halftones subject to dot gain and of ink-layer thickness no longer negligible with respect to the coating layer thickness. The light interactions and equations at the origin of the model are displayed in
Figure 5.
The coating is a smooth clear layer in optical contact with the printed support, which is supposed to be perfectly diffusing, i.e., Lambertian. Let us illuminate the coating layer of optical index
n1 with a uniform irradiance
E at normal incidence. Light is partially reflected by the air-coating interface to a proportion denoted
rs. The light transmitted through the interface, a proportion
Tin, transits through the transparent layer and reaches the inked support. It can then be partially absorbed by inked areas or transmitted through it to a proportion denoted
t, the intrinsic transmittance, which is spatially and spectrally dependent of the halftone. At position (
x,
y) on the halftone and at wavelength
, it is equal to:
where
ρ is the spatial and spectral intrinsic reflectance of the halftone, and
ρ0 is the spectral intrinsic reflectance of the substrate, averaged over a small area. Intrinsic reflectance represents the light reflected by a material regardless of its interface with air. For a halftone, which has the same optical index as the coating layer,
n1 = 1.5, the intrinsic reflectance derives from the Williams-Clapper reflectance model [
8] and is equal to:
RNC denotes the reflectance of the non-coated halftone,
Tout is the light proportion which is transmitted by the material-air interface –it is the same whether the material is the halftone or the coating layer–, and
ri is the light proportion which is internally reflected by the material-air interface.
rs,
ri,
Tin, and
Tout depend on the material’s optical index and on the measurement geometry. They can be derived from the Fresnel reflectance and transmittance at the interface [
29].
ρ0 derives from the same formula as
ρ. As the printed support and the coating layer have generally similar optical indices and are in optical contact, the interface between them has no optical effect and light travels from one to the other along straight lines. After being partially absorbed by the ink layer, light reaches the paper and is reflected into a proportion , the same in all directions since the substrate is a Lambertian reflector.
The light emerging from the substrate along the normal of the print is absorbed into a proportion
t and emerges from the halftone with an exitance
M1 (dependency on wavelength will be omitted in the following equations):
The light emerging from the substrate with a high angle of incidence travels a longer path in the absorbing ink layer than light with a small angle of incidence, which results in a higher absorption by the ink layer. This is taken into account by introducing a free parameter
γ representing the ratio between the high incidence path length and the normal incidence path length. The intrinsic transmittance then becomes
tγ, according to Beer’s Law. The exitance for light emerging with a high angle of incidence is then:
The light emerging from the substrate and reaching the coating-air interface is either transmitted through the interface to an extent
Tout and can be captured by the sensor, or it is reflected towards the halftone to an extent
ri. Yet, this reflection on the coating-air interface induces a specific halo shape which has an impact on the spatial and overall reflectance of the coated halftone. This halo shape is due to the Fresnel reflectance at the interface: if light rays reach the interface with a small angle of incidence, Fresnel reflectance is low, and light is transmitted through the interface. If light rays reach the interface with an angle higher than the critical angle equal to arcsin(1/
n1), the Fresnel reflectance is 1 and light is completely reflected back towards the substrate. The critical angle is 42° for the coating-air interface. The irradiance on the halftone issued from the halo effect is mapped in
Figure 6.
The dark disk in the middle of the halo pattern corresponds to a low irradiance of the substrate produced by the small amount of light internally reflected by the interface at law incidence angles. The bright ring is produced by the rays totally reflected by the interface because their incidence angle is higher than 42°. The ring has a diameter
, with
d the thickness of the coating layer, and fades in a cos
4 similarly to the irradiance of a small extended light source on a plane. This halo is described by a function
h:
where
is the Fresnel reflectance at the coating-air interface, and
d is the thickness of the coating layer.
It is verified that light is reflected at the interface to the same extent with the halo function as with
ri:
Most of the light coming back towards the substrate has an angle of incidence higher than 42°, it is thus subject to high absorption by the ink dots.
The light reflected towards the halftone after reflection on the coating-air interface and absorption by the ink layer produces an irradiance
E1 of the substrate in each point (
x,
y)
where symbol
denotes the 2D spatial convolution operator.
After reflection on the substrate, the exitance along the normal of the print is:
M2γ, the exitance at a high angle is
It produces again a halo reilluminating the substrate, and so on. The successive exitances
satisfy the recursive equation:
We can show that beyond
k = 10, the exitance
is close to zero and the total exitance which is the sum of all exitances
, can be approximated by the corresponding truncated sum. Therefore, the radiance
observed from a certain direction, after crossing the interface (factor
Tout), is given by:
The spatial reflectance factor of the coated print is the external reflectance
rs of the upper interface—equal to zero in the specular excluded configuration—, plus the internal contribution given by the spatial value of radiance
, divided by the radiance
1/π scattered by a perfect white diffuser in same direction and under unit irradiance [
30]:
The underlaying assumptions under the use of the intrinsic reflectances in the model, Equation (5), is that the light propagation inside the substrate, causing optical dot gain, does not vary whether the substrate is coated or not. In other words, it implies that the interface between the halftone and air has no impact on the substrate point spread function (PSF), and that halo effect and dot gain are two independent phenomena. This is a strong assumption but some more complex simulations including the paper PSF that we have tested have not shown any improvement over the hereby presented model.
2.3. Experimental Method and Computation
To observe the effect of the coating layer and test the optical model, an experiment has been conducted on various halftones. The spectral reflectance of the halftone samples was measured before and after applying the coating layer, and the thickness of the coating layer was evaluated. From the non-coated halftone reflectances and the layer thickness, the model can be calibrated to predict the reflectance of the coated halftones, which can then be compared to the experimental ones.
To evaluate both the spectral and the spatial performances of the model, various halftones were designed with Adobe Photoshop
®: two samples were composed of 8 patches of various periods made of an alternance of white and colored lines, respectively, magenta and cyan. The nominal periods of the lines were: 0.169, 0.254, 0.339, 0.423, 0.508, 0.847, 1.270 and 2.117 mm (corresponding to, respectively, 150, 100, 75, 60, 50, 30, 20, and 12 lpi), and the nominal ink surface coverage was 0.5. Pictures of the halftones are displayed in
Section 3. Two additional patches were measured, corresponding to the substrate without ink and the substrate fully covered by ink (surface coverage 0, respectively, 1). The first one is needed to calibrate the model. The samples were printed on white coated paper (90 g/m
2, Bekk smoothness ~2000 s) with an electrophotographic printer (Xerox versant 180, toner references 006R01643 for cyan and 006R01644 for magenta). The coated paper had the
L*
a*
b* coordinates:
L* = 95,
a* = 1.4,
b* = −4.5, measured on a white background with a 45°:0° spectrophotometer in M1 condition with D50 illuminant, which corresponds to the PS1 (Premium coated) of ISO 12647-2: 2013. The printer resolution was 1200 dpi, and the print resolution was 600 dpi. The halftone generation on Adobe Photoshop
® was conducted using the bitmap mode and a line threshold matrix. Any automatic color management was disabled. The halftones were printed through the Xerox Freeflow Software in direct CMJN printing mode. The electrophotographic printing process was selected to ensure that the colorant, i.e., the toner, did not penetrate the substrate, which could lead to complex light-matter interactions.
The spatial microscopic reflectances of the halftones were captured with the custom-built multispectral microscope previously detailed. It has a geometry 0°:0°, specular component excluded. Halftones were captured in HDR to ensure that both inked and non-inked areas were non-saturated. The exposure time for each filter ranged from 0.4 s to 30 s depending on the optical filter and on the color of the halftone.
For the coating process, the samples were laminated with a bright transparent foil theoretically 25 µm thick, with the laminator DRY 350 W from RBS. The lamination foil was composed of OPP and was considered perfectly transparent (its intrinsic transmittance was above 0.993). The temperature of the laminator was 110° and a coating speed of approximately 0.9 m/min was chosen. The silicon lamination rollers were 0.04 mm apart. To determine the thickness of the coated foil, thickness measurements were conducted on the prints before and after coating. The measurements were made with a micrometer from Adamel Lhomargy (m120, 15 mm diameter probe). Each patch was measured 3 times, the average thickness over each patch was used to initialize the optical model.
After the coating step, reflectances of the samples were measured again with the microscope. Each patch, coated and non-coated, was also measured twice with the spectrophotometer CM-2600d from Konica Minolta, 8 mm aperture, with a di:8° geometry and with a UV filter to prevent fluorescence.
Afterwards, the same experiment was enlarged to more complex halftones: a third sample was designed, composed of cyan, magenta, yellow and black inked dots arranged in a rosette pattern. Each ink had a nominal surface coverage of 0.25. Two patches were made with this pattern with different periods.
The magenta and multicolored halftone reflectances were measured by setting the sample over a white support, and the cyan halftone reflectances were measured over a black support. Even if the support had an impact on the reflectance measurement due to the transparency of the paper, it did not seem to impact the quality of the predictions.
The microscope induces spherical and chromatic aberrations which slightly blur the edges of the images. In the computation, microscope images of the line halftones were then cropped to an integer number of periods at the center of the image. One image was the exception, the coated magenta 1.270 mm-period line halftone (patch 7), which was cropped to the edge of the image due to experimental difficulties further detailed in the discussion section. The images of the multicolored halftone prints were also cropped to the center of the images but still contained enough printed dots so that cropping has no impact on the average reflectance. The image sizes were in the range of 1728 × 302 pixels and 1728 × 1533 pixels, with 13 wavelengths.
Pixels discarded during calculations because they were saturated or had an outranged reflectance represented an average of 0.12% of the pixels in the images, with high variations according to the samples and to the optical filters. The value reached an average of 1.3% for the worst sample, and 7.0 × 10−5% for the best sample.
The model was calibrated by measuring spatial reflectances,
RNC, of the non-coated halftones and of the bare substrate, with which intrinsic reflectances were determined through Equation (6). Halo function
h of the model was implemented through a 501 × 501 matrix of pixel pitch equal to the pixel pitch of the microscope images. It was calculated for each patch with the same coating thickness as the measured one. The size of the halo matrix was limited to enable the calculations of the 2D convolutions. The equality (10) is important for the accuracy of the model: the limited size of the halo matrix induced a small error which was compensated by adding a small scalar to all points of the halo matrix. The implemented
h is presented in
Figure 6. Parameter
γ was fitted with experimental values of the magenta halftones with a model accounting for 1 spatial dimension giving similar results as the 2D model on line halftones.
γ was found to be 1.23. The same value was used for the other halftones. The computations lasted approximately 70 seconds per patch.
This computation enables to compare the reflectances given by the model in Equation (15) with the spatial reflectances of the coated halftones measured with the multispectral microscope.