Bonfigli, F.; Botti, S.; Vincenti, M.A.; Montereali, R.M.; Rufoloni, A.; Gaudio, P.; Rossi, R.
Fluorescence and Raman Micro-Spectroscopy of LiF Films Containing Radiation-Induced Defects for X-ray Detection. Condens. Matter 2023, 8, 103.
https://doi.org/10.3390/condmat8040103
AMA Style
Bonfigli F, Botti S, Vincenti MA, Montereali RM, Rufoloni A, Gaudio P, Rossi R.
Fluorescence and Raman Micro-Spectroscopy of LiF Films Containing Radiation-Induced Defects for X-ray Detection. Condensed Matter. 2023; 8(4):103.
https://doi.org/10.3390/condmat8040103
Chicago/Turabian Style
Bonfigli, Francesca, Sabina Botti, Maria Aurora Vincenti, Rosa Maria Montereali, Alessandro Rufoloni, Pasquale Gaudio, and Riccardo Rossi.
2023. "Fluorescence and Raman Micro-Spectroscopy of LiF Films Containing Radiation-Induced Defects for X-ray Detection" Condensed Matter 8, no. 4: 103.
https://doi.org/10.3390/condmat8040103
APA Style
Bonfigli, F., Botti, S., Vincenti, M. A., Montereali, R. M., Rufoloni, A., Gaudio, P., & Rossi, R.
(2023). Fluorescence and Raman Micro-Spectroscopy of LiF Films Containing Radiation-Induced Defects for X-ray Detection. Condensed Matter, 8(4), 103.
https://doi.org/10.3390/condmat8040103
