Contour Measurement of Object with Arbitrary Surface Using Two-Dimensional Shearography with Source Displacement
Abstract
:1. Introduction
2. Methods
2.1. One-Dimensional Digital Shearography with Source Displacement
2.2. Two-Dimensional Digital Shearography with Source Displacement
2.3. Reconstruction of the Contour by the 2D Integration
3. Results and Discussion
3.1. Contour Measurement
3.2. Non-Destructive Testing Applications
4. Conclusions
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
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Yu, M.; Wu, S.; Li, W.; Si, J. Contour Measurement of Object with Arbitrary Surface Using Two-Dimensional Shearography with Source Displacement. Optics 2022, 3, 352-363. https://doi.org/10.3390/opt3040031
Yu M, Wu S, Li W, Si J. Contour Measurement of Object with Arbitrary Surface Using Two-Dimensional Shearography with Source Displacement. Optics. 2022; 3(4):352-363. https://doi.org/10.3390/opt3040031
Chicago/Turabian StyleYu, Miao, Sijin Wu, Weixian Li, and Juanning Si. 2022. "Contour Measurement of Object with Arbitrary Surface Using Two-Dimensional Shearography with Source Displacement" Optics 3, no. 4: 352-363. https://doi.org/10.3390/opt3040031
APA StyleYu, M., Wu, S., Li, W., & Si, J. (2022). Contour Measurement of Object with Arbitrary Surface Using Two-Dimensional Shearography with Source Displacement. Optics, 3(4), 352-363. https://doi.org/10.3390/opt3040031