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Pugliese GM, Tortora L, Paris E, Wakita T, Terashima K, Puri A, Nagao M, Higashinaka R, Matsuda TD, Aoki Y, et al. The Local Structure of the BiS₂ Layer in RE(O,F)BiS₂ Determined by In-Plane Polarized X-ray Absorption Measurements. Physchem. 2021; 1(3):250-258. https://doi.org/10.3390/physchem1030019

Pugliese, G. M., L. Tortora, E. Paris, T. Wakita, K. Terashima, A. Puri, M. Nagao, R. Higashinaka, T. D. Matsuda, Y. Aoki, and et al. 2021. "The Local Structure of the BiS₂ Layer in RE(O,F)BiS₂ Determined by In-Plane Polarized X-ray Absorption Measurements" Physchem 1, no. 3: 250-258. https://doi.org/10.3390/physchem1030019

Pugliese, G. M., Tortora, L., Paris, E., Wakita, T., Terashima, K., Puri, A., Nagao, M., Higashinaka, R., Matsuda, T. D., Aoki, Y., Yokoya, T., Mizokawa, T., & Saini, N. L. (2021). The Local Structure of the BiS₂ Layer in RE(O,F)BiS₂ Determined by In-Plane Polarized X-ray Absorption Measurements. Physchem, 1(3), 250-258. https://doi.org/10.3390/physchem1030019