Advanced Imaging Methods
A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Inorganic Crystalline Materials".
Deadline for manuscript submissions: closed (31 August 2021) | Viewed by 18481
Special Issue Editors
Interests: X-ray microscopy; X-ray optics; nanofabrication; focused ion beams and advanced materials
Interests: X-ray optics; Fresnel zone plates; atomic layer deposition; ion beam lithography; thin films
Special Issue Information
Dear Colleagues,
The impact of the explosive growth in our technology and economy on the environment and our daily lives is becoming increasingly more evident. New materials solutions are essential to ensure growth while minimizing repercussions and facilitating a transformation to a more sustainable economy. Our ability to control matter at progressively smaller scales will prove instrumental in ensuring this change. Accordingly, the visualization of complex matter at a variety of time and length scales is a critical tool in providing the information feedback to improve the processes that will deliver the next generation of materials solutions. These include battery particles for high power density energy storage, more efficient solar or thermal energy conversion devices, new quantum electronic materials for efficient computing, higher-density and faster magnetic storage devices, and novel biomaterials for improved biocompatibility in medical devices.
To address these requirements, we would like to invite papers to our Special Issue on “Advanced Imaging Methods” to focus on applications of the visualization of matter from the atomic scale to mesoscale in 2, 3, and 4 dimensions. We want to cover a broad range of topics, from focused ion beams to scanning and transmission electron microscopes and both synchrotron and laboratory-based X-ray microscopes. Topics covered include direct and coherent imaging, such as ptychography and coherent diffractive imaging of nanomaterials, and time-resolved imaging.
This Special Issue on “Advanced Imaging Methods” is intended to provide an up-to-date overview of the recent developments in imaging of matter with novel properties.
Dr. Kahraman Keskinbora
Dr. Umut T. Sanli
Dr. Sebastian Wintz
Guest Editors
Manuscript Submission Information
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Keywords
- X-ray microscopy
- Electron microscopy
- Focused ion beams
- Time-resolved microscopy
- Tomography
- Coherent imaging
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