Polycrystalline Materials–from Design to (Micro)Structural Characterization and Applications
A special issue of Crystals (ISSN 2073-4352). This special issue belongs to the section "Crystal Engineering".
Deadline for manuscript submissions: closed (31 July 2024) | Viewed by 14683
Special Issue Editors
Interests: crystallography; powder diffraction; structural and microstructural analysis; electrochemistry; batteries; thin films; mechanochemistry; metal-organic compounds
Special Issue Information
Dear Colleagues,
Despite numerous attempts, it can be very challenging to obtain a single crystal with a straightforward structural solution. In recent years, the development of computer programs for solving structure solution and analyzing powder diffraction data has enabled the crystal structure of polycrystalline materials to be determined, making powder X-ray diffraction an even more valuable method. When it comes to synthetic procedures that exclusively produce polycrystalline material, for instance, mechanochemical synthesis, the use of powder X-ray diffraction is essential. This also applies to polycrystalline thin films.
It is possible not only to determine the purity of the sample, but also to determine new structures from powder X-ray diffraction data to obtain information about the microstructural features, porosity and thermal expansion of the material. The morphology of the sample can have a significant effect on its properties; therefore, we encourage any research findings that compare the properties of the same compound in different states, such as powders vs. thin films or single crystals. Additionally, even when it seems that X-ray diffraction data do not provide enough information to fully determine the structure of a material, the impossible becomes possible when combined with other analytical tools, such as solid-state NMR, IR spectroscopy, Raman, and many other techniques.
The main idea of this Special Issue is to relate synthetic processes to the crystal structure and microstructure of the compounds produced, as well as to the properties and potential applications. We invite all scientists, both synthetic chemists and colleagues working in the field of X-ray diffraction, microstructural analysis or software development for the analysis of powder diffraction data, to submit their research for evaluation and help to make this Special Issue a valuable contribution to the scientific community. In particular, if you have found a potential application of a material, such as a high conductivity, multiferroics, gas sorption/separation properties, interesting thermal expansion behavior, etc., you are invited to share your important findings with us.
We look forward to your contributions in the form of communications, full articles, or review papers.
Dr. Sanja Burazer
Dr. Lidija Androš Dubraja
Guest Editors
Manuscript Submission Information
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Keywords
- structure determination from PXRD data
- microstructural analysis
- powder diffraction software
- Rietveld refinement
- polycrystalline thin films
- synchrotron radiation
- spin coating
- mechanochemistry
- solvothermal synthesis
- electrochemical materials
- magnetic materials
- thermal expansion materials
- porous materials
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