Development of Time-Resolved X-Ray Crystallography
A special issue of Crystals (ISSN 2073-4352).
Deadline for manuscript submissions: closed (31 March 2017)
Special Issue Editor
Interests: microscopic origin of physical properties of crystals; crytallography and physical properties of ferroelectric materials; single-crystal X-ray diffractometry; physics of piezoelectric materials; perturbation crystallography; investigation of electron density and chemical bonds in crystals; time resolved X-ray diffraction; domains dynamics in ferroic materials
Special Issue Information
Dear Colleagues,
Since the discovery of X-ray diffraction in 1912, X-ray crystallography has become a major experimental technique, which shapes modern solid state science. The development of X-ray diffractometers, third-generation synchrotron radiation sources, pixel array detectors, data-analysis algorithms, and software packages have made crystal structure determinations routine in almost all occasions.
However, the same instrumental developments have initiated the emergence of time-resolved X-ray crystallography—an innovative experimental science—which investigates the dynamics of solids and questions how crystal structures adapt to rapidly changing external conditions. It covers the processes, occurring on time scales between femtoseconds and seconds, and within the length scales between pico-meters and the macroscopic dimensions of a material. Time-resolved X-ray crystallography is of interest for the communities of crystallographers, solid state physicists, material scientists, chemists, and biologists. It also poses a serious challenge for instrumental science. The on-going development of diffraction-limited synchrotron storage rings and X-ray free electron lasers offers a particularly exciting and largely unexplored research venue.
This Special Issue is intended to provide a reference for the state-of-the-art in time-resolved X-ray crystallography. We welcome submissions related to original research, reviews, approaches for data-analysis, and relevant instrumental developments, including modern synchrotron diffraction opportunities, X-ray free electron lasers, multi-channel analyzers, and lab-based pulsed X-ray sources.
Dr. Semën Gorfman
Guest Editor
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Keywords
- time-resolved X-ray diffraction
- structural dynamics
- stroboscopic data-acquisitions
- Laue diffraction
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