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Electronics
Special Issues
Reliability, Fault Tolerance and Safety of Electronic Devices and Systems
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Reliability, Fault Tolerance and Safety of Electronic Devices and Systems

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Systems & Control Engineering".

Deadline for manuscript submissions: 15 August 2025 | Viewed by 1935

Special Issue Editor

Dr. Corrado De Sio

E-Mail Website
Guest Editor
Dipartimento di Automatica e Informatica (DAUIN), Politecnico di Torino, 10129 Turin, Italy
Interests: reliability and fault tolerance of electronic systems; reconfigurable devices; radiation effects

Special Issue Information

Dear Colleagues,

This Special Issue discusses the reliability, fault tolerance, and safety of electronic devices and systems. It aims to explore the latest advancements, challenges, and methodologies in electronic devices and systems analysis and focuses on the analysis, understandability, tolerance, and mitigation of faults and errors in electronic devices and systems, especially safety-critical and mission-critical applications and systems.

Topics of interest include, but are not limited to, the following:

  • The reliability of complex systems (microprocessors, FPGA, SoCs, GPUs, etc.);
  • CAD tools for the analysis, safety, and robust design of circuits and systems;
  • Fault injection techniques and frameworks;
  • The analysis and mitigation of transient errors;
  • Validation and verification in safety-critical applications;
  • Monitoring and fault detection for devices and systems;
  • Fault-tolerant hardware and software architectures;
  • Single-event effect analysis, modeling, and hardening;
  • Error detection, correction, and recovery;
  • Case studies of safety-critical applications and systems;
  • Self-testing and self-repairing systems.

Dr. Corrado De Sio
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • analysis
  • dependability
  • fault tolerance
  • reliability
  • radiation effects

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Published Papers (2 papers)

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Research

25 pages, 2501 KiB  
Article
A MCDM-Based Analysis Method of Testability Allocation for Multi-Functional Integrated RF System
by Chao Zhang, Yiyang Huang, Dingyu Zhou, Zhijie Dong, Shilie He and Zhenwei Zhou
Electronics 2024, 13(18), 3618; https://doi.org/10.3390/electronics13183618 - 12 Sep 2024
Cited by 1 | Viewed by 790
Abstract
The multi-functional integrated RF system (MIRFS) is a crucial component of aircraft onboard systems. In the testability design process, traditional methods cannot effectively deal with the inevitable differences between system designs and usage requirements. By considering the MIRFS’s full lifecycle characteristics, a new [...] Read more.
The multi-functional integrated RF system (MIRFS) is a crucial component of aircraft onboard systems. In the testability design process, traditional methods cannot effectively deal with the inevitable differences between system designs and usage requirements. By considering the MIRFS’s full lifecycle characteristics, a new testability allocation method based on multi-criteria decision-making (MCDM) is proposed in this paper. Firstly, the testability framework was constructed and more than 100 indicators were given, which included both different system-level and inter-system indicators. Secondly, to manage parameter diversity and calculate complexity, the basic 12 testability indicators were optimized through the Analytic Hierarchy Process and Technique for Order Preference by Similarity to Ideal Solution (AHP-TOPSIS) method. Thirdly, the detailed testability parameters were obtained by using the Decision-Making Trial and Evaluation Laboratory and Analytic Network Process (DEMATEL-ANP) to reduce the subjectivity and uncertainty. Finally, an example was utilized, and the results show that the MCDM method is significantly better than traditional methods in terms of accuracy and effectiveness, which will provide a more scientific basis for the MIRFS testability design process. Full article
(This article belongs to the Special Issue Reliability, Fault Tolerance and Safety of Electronic Devices and Systems)
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28 pages, 7506 KiB  
Article
Towards Double-Layer Dynamic Heterogeneous Redundancy Architecture for Reliable Railway Passenger Service System
by Xinghua Wu, Mingzhe Wang, Jinsheng Shen and Yanwei Gong
Electronics 2024, 13(18), 3592; https://doi.org/10.3390/electronics13183592 - 10 Sep 2024
Viewed by 693
Abstract
Researchers have proposed the dynamic heterogeneous redundancy (DHR) architecture, which integrates dynamic, heterogeneous, redundant, and closed-loop feedback elements into the system, to fortify the reliability of the railway passenger service system (RPSS). However, there are at least two weaknesses with the common DHR [...] Read more.
Researchers have proposed the dynamic heterogeneous redundancy (DHR) architecture, which integrates dynamic, heterogeneous, redundant, and closed-loop feedback elements into the system, to fortify the reliability of the railway passenger service system (RPSS). However, there are at least two weaknesses with the common DHR architectures: (1) they need system nodes with enough computing and storage resources; (2) they have hardly considered the reliability of DHR architecture. To this end, this paper proposes a double-layer DHR (DDHR) architecture to ensure the reliability of RPSS. This architecture introduces a set of algorithms, which are optimized co-computation and ruling weight optimization algorithms for the data processing flow of the DDHR architecture. This set improves the reliability of the DDHR architecture. For the evaluation of the reliability of DDHR architecture, this paper also proposes two metrics: (1) Dynamic available similarity metric. This metric does not rely on the overall similarity of the double-layer redundant executor sets but evaluates the similarity of their performance under the specified interaction paths within a single scheduling cycle. The smaller its similarity, the higher its reliability. (2) Scheduling cycle under dual-layer similarity threshold. This metric evaluates the reliability of the RPSS under actual conditions by setting the schedulable similarity thresholds between the same and different layers of the dual-layer redundant executives in the scheduling process. Finally, analog simulation experiments and prototype system building experiments are carried out, whose numerical experimental results show that the DDHR architecture outperforms the traditional DHR architecture in terms of reliability and performance under different redundancy and dynamically available similarity thresholds, while the algorithmic complexity and multi-tasking concurrency performance are slightly weaker than that of the DHR architecture, but can be applied to the main operations of the RPSS in general. Full article
(This article belongs to the Special Issue Reliability, Fault Tolerance and Safety of Electronic Devices and Systems)
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