Advances in Machine Condition Monitoring and Fault Diagnosis
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Industrial Electronics".
Deadline for manuscript submissions: closed (30 April 2022) | Viewed by 45980
Special Issue Editors
Interests: marine and offshore renewable energy; condition monitoring; fault diagnosis; maintenance; reliability; signal processing; computational fluid dynamics; hydrodynamics; wind farm management; offshore engineering; electric vehicles
Special Issues, Collections and Topics in MDPI journals
Interests: technical diagnostics; condition monitoring gearboxes; bearings; mining machines signal processing; data analysis time varying systems pattern recognition
Interests: non-destructive evaluation; structural health monitoring; condition monitoring; machine learning; digital twins
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Condition monitoring and fault diagnosis have demonstrated its effectiveness in improving the operation, maintenance, availability and therefore economic return of machines. They will play a more vital role in the future industrial production process with the rapid development of modern machinery industry. That requests the condition monitoring and fault diagnosis techniques to be more reliable and efficient in practical use. However, this is challenged by the fact that modern machines are becoming more complex in structure, larger in size, and operate under harsher loading and operational conditions. This Special Issue will provide an open platform for reporting and sharing the latest advances in this field. The topics of interest for publication in this Special issue include, but are not limited to, the following:
- Machine condition monitoring
- Structural health condition monitoring
- Signal processing
- Data analysis
- Image processing
- Fault diagnosis
- Non-destructive testing
- Non-destructive evaluation
- Mathematical models for health monitoring
- Data mining
- Artificial intelligence
Dr. Wenxian Yang
Prof. Dr. Radoslaw Zimroz
Dr. Mayorkinos Papaelias
Guest Editors
Manuscript Submission Information
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Keywords
- Condition monitoring
- Fault diagnosis
- Signal processing
- Data analysis
- Non-destructive testing
- Non-destructive evaluation
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