Analysis and Test of Microwave Circuits and Subsystems
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".
Deadline for manuscript submissions: closed (20 October 2022) | Viewed by 24080
Special Issue Editors
Interests: RF; microwaves; noise; instrumentation; RF LINAC
Special Issue Information
Dear Colleagues,
The aim of this Special Issue on “Analysis and Test of Microwave Circuits and Subsystems” is to cover the latest advancements in analysis methods and measurement techniques concerning the broad catalogue of applications of microwave circuits and subsystems, from radio to satellite communications, microwave sensing and ranging, biomedical applications, RF particle acceleration, etc. The increasing complexity of signals, circuits, and systems is challenging analysis and test techniques to succeed in the functionality of current solutions and to explore new ones. Analysis techniques must help in the design and optimization of linear and nonlinear circuits, including electrical, electromagnetic, and thermal simulations. Analysis under complex stimuli and in the presence of different sources of noise and interfering signals is of great interest. Multiphysics and co-simulation at circuit and system levels from detailed device and circuit model descriptions or using intermediate reduced-order modeling or behavioral modeling approaches are also producing advances in the field. Test procedures have to cover from device characterization and modeling to the evaluation of circuit and system performances as well as their stability over time under different operating conditions.
Dr. Joaquin Portilla
Prof. Dr. Patrick Roblin
Prof. Dr. Jean-Christophe Nallatamby
Guest Editors
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Keywords
- microwave circuit analysis techniques
- multiphysics and co-simulation methodologies for microwave circuits and subsystems
- measurement of linear and nonlinear circuits and subsystems, including complex excitations and noise
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