About Metrology

Aims

Metrology (ISSN 2673-8244) is an international, peer-reviewed, open access journal that provides an advanced forum for articles covering theory, design, and application in measurement science or measurement technology. Metrology publishes full research papers, communications, and review articles as well as Special Issues on particular subjects.

Scope

The name Metrology hints that the journal’s focus is on the formal definition of metrology: “metrology is the science of measurement and its application” [1], where it is noted that metrology includes all theoretical and practical aspects of measurement, regardless of what the measurement uncertainty and field of application may be. This broad scope does not imply that any modeled or physical measurement can be published in Metrology: rather, the journal is concerned with innovative concepts, new perspectives, and illustrations of applications from which other readers can benefit, operating beyond the traditional boundaries between metrology fields. Basic metrological concepts such as uncertainty evaluation and traceability to the seven base units of the International System of Units are the natural background and requirement for all contributions.

Metrology covers a broad range of areas, such as studies related to the following topics:

• Traceability to SI units of complex measurement systems;
• Measurement theory in a broad context;
• Measurement uncertainty and uncertainty evaluation;
• Considerations on the fundamentals of measurement;
• Error separation methods;
• Novel methods inspired by the redefinition of the SI;
• Cyberphysical systems;
• Artificial intelligence, especially its effect on traceability;
• Machine learning for metrology;
• Precision measurement;
• Digital twins;
• Metrology for sustainable manufacturing;
• Precision manufacturing;
• Measurement techniques and devices;
• Interferometry;
• XCT measurements;
• 3D metrology;
• Frequency metrology;
• Surface metrology;
• Biomedical measurement;
• Virtual measurement;
• Power measurement.
  
  

1. International vocabulary of metrology – Basic and general concepts and associated terms, 2012, Joint Committee for Guides in Metrology (JCGM). Available Online: https://www.bipm.org/documents/20126/2071204/JCGM_200_2012.pdf/f0e1ad45-d337-bbeb-53a6-15fe649d0ff1 (accessed on 12 October 2021)

MDPI Publication Ethics Statement

MDPI is a member of the Committee on Publication Ethics (COPE). MDPI takes the responsibility to enforce a rigorous peer-review together with strict ethical policies and standards to ensure to add high quality scientific works to the field of scholarly publication. Unfortunately, cases of plagiarism, data falsification, inappropriate authorship credit, and the like, do arise. MDPI takes such publishing ethics issues very seriously and our editors are trained to proceed in such cases with a zero tolerance policy. To verify the originality of content submitted to our journals, we use iThenticate to check submissions against previous publications.

Book Reviews

Authors and publishers are encouraged to send review copies of their recent related books to the following address. Received books will be listed as Books Received within the journal's News & Announcements section.

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Copyright / Open Access

Articles published in Metrology will be Open-Access articles distributed under the terms and conditions of the Creative Commons Attribution License (CC BY). The copyright is retained by the author(s). MDPI will insert the following note at the end of the published text:

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