Advanced Sensing and Machine Learning Techniques in Process Monitoring and Fault Diagnosis
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Fault Diagnosis & Sensors".
Deadline for manuscript submissions: closed (30 September 2022) | Viewed by 30129
Special Issue Editors
Interests: machine learning; structural optimization; additive manufacturing; metamodeling; systems design; product development; materials processing; engineering design; simulation modeling; robust optimization
Interests: integrated design and manufacturing; machine learning; optimization; intelligent systems; design under uncertainty; bayesian statistics; uncertainty quantification; reliability; sampling; stochastic; control systems
Interests: machine learning; laser welding; additive manufacturing; processing parameter optimization; mechanical properties; microstructure; materials processing; mechanical engineering; numerical simulation; patient simulation; manufacturing engineering
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Special Issue Information
Dear Colleagues,
Over the past few decades, machine learning and artificial intelligence (ML/AI) techniques, such as the emerging deep learning methods, have attracted much attention in computer-based advanced manufacturing and prognostic and health management. A comprehensive information physical system based on advanced sensing and machine learning, however, is still missing in advanced manufacturing and fault diagnosis. Developing such a comprehensive diagnostics system requires novel developments related to intelligent information physical systems, advanced sensing techniques, deep analysis and sensor fusion, adaptability of artificial intelligence technology to complex environments, and specific working conditions.
This Special Issue is dedicated to novel articles covering advanced sensing and machine learning in process monitoring and fault diagnosis. Topics of interest include but are not strictly limited to the following:
- Generalized approaches for data fusion from multiple sensors;
- Novel approaches for processing of multiple sensors’ signals at multiple scales;
- Novel machine learning approaches for fault diagnosis;
- Data-driven-based process monitoring;
- Data-driven-based fault diagnosis;
- Hybrid-model-based and data-driven process monitoring;
- Hybrid-model-based and data-driven fault diagnosis;
- Deep learning fault diagnosis method under unbalanced data;
- Fault diagnosis method with limited fault data;
- Smart sensor systems for defect detection and quality evolution.
Prof. Dr. Qi Zhou
Prof. Dr. Zhen Hu
Dr. Longchao Cao
Guest Editors
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