Microwave Techniques for Spectroscopy and Imaging Applications
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: closed (31 May 2024) | Viewed by 12201
Special Issue Editors
Interests: metamaterials for high-frequency applications; microwave components with a focus on RF MEMS and NEMS; microwave and millimeter wave components for space and security; scanning microwave microscopy for magnetic, semiconducting, and dielectric materials
Special Issues, Collections and Topics in MDPI journals
Interests: microwave measurements for cultural heritage applications; microwave tomography; RF MEMS
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Microwaves have been utilized for decades, mainly in systems for telecommunication applications. On the other hand, the penetration of microwaves, especially at frequencies not exceeding the C-Band, promoted additional fields of interest, encompassing material science, cultural heritage and biological imaging. Near field measurement techniques have been developed for local characterization of dielectric and magnetic properties of materials. Actually, spectroscopy and imaging of small areas with purposely shaped tips is now possible to detect sub-surface buried metallization and to observe dielectric inclusions by processing microwave reflected signals. Magnitude and phase of scattering parameters, the typical quantities recorded in microwave measurements, are useful for both image reconstruction and local properties determination. At a different scale, involving macroscopic samples, spectroscopy and 3D imaging is performed using a number of antennas placed around the structure to be measured, to get information about internal discontinuities generated again by the presence of metals or regions exhibiting different values of the dielectric constant. So far, general concepts can be shared among different fields, but actual solutions and physical modelling are quite different, comparing micro- and macro-setups necessary for the characterization. In this Special Issue, the basic concepts of spectroscopy and imaging based on microwave measurements will be discussed, together with the inverted reconstruction algorithms for post-processing raw data to generate the image.
Dr. Romolo Marcelli
Dr. Emanuela Proietti
Guest Editors
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Keywords
- microwave spectroscopy and imaging
- near field microscopy
- dielectric constant measurement
- image reconstruction algorithms
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