Singh, P.K.; Singh, S.; Deng, Z.; He, X.; Kehel, Z.; Singh, R.P.
Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. Int. J. Mol. Sci. 2019, 20, 5432.
https://doi.org/10.3390/ijms20215432
AMA Style
Singh PK, Singh S, Deng Z, He X, Kehel Z, Singh RP.
Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. International Journal of Molecular Sciences. 2019; 20(21):5432.
https://doi.org/10.3390/ijms20215432
Chicago/Turabian Style
Singh, Pawan Kumar, Sukhwinder Singh, Zhiying Deng, Xinyao He, Zakaria Kehel, and Ravi Prakash Singh.
2019. "Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population" International Journal of Molecular Sciences 20, no. 21: 5432.
https://doi.org/10.3390/ijms20215432
APA Style
Singh, P. K., Singh, S., Deng, Z., He, X., Kehel, Z., & Singh, R. P.
(2019). Characterization of QTLs for Seedling Resistance to Tan Spot and Septoria Nodorum Blotch in the PBW343/Kenya Nyangumi Wheat Recombinant Inbred Lines Population. International Journal of Molecular Sciences, 20(21), 5432.
https://doi.org/10.3390/ijms20215432