Liu, Y.; Qie, Y.; Li, X.; Wang, M.; Chen, X.
Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410. Int. J. Mol. Sci. 2020, 21, 478.
https://doi.org/10.3390/ijms21020478
AMA Style
Liu Y, Qie Y, Li X, Wang M, Chen X.
Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410. International Journal of Molecular Sciences. 2020; 21(2):478.
https://doi.org/10.3390/ijms21020478
Chicago/Turabian Style
Liu, Yan, Yanmin Qie, Xing Li, Meinan Wang, and Xianming Chen.
2020. "Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410" International Journal of Molecular Sciences 21, no. 2: 478.
https://doi.org/10.3390/ijms21020478
APA Style
Liu, Y., Qie, Y., Li, X., Wang, M., & Chen, X.
(2020). Genome-Wide Mapping of Quantitative Trait Loci Conferring All-Stage and High-Temperature Adult-Plant Resistance to Stripe Rust in Spring Wheat Landrace PI 181410. International Journal of Molecular Sciences, 21(2), 478.
https://doi.org/10.3390/ijms21020478