Xie, Z.; Li, Y.; Sun, L.; Wu, W.; Cao, R.; Tao, X.
A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging. Sensors 2020, 20, 2670.
https://doi.org/10.3390/s20092670
AMA Style
Xie Z, Li Y, Sun L, Wu W, Cao R, Tao X.
A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging. Sensors. 2020; 20(9):2670.
https://doi.org/10.3390/s20092670
Chicago/Turabian Style
Xie, Zipeng, Yongjie Li, Liguo Sun, Wentao Wu, Rui Cao, and Xiaohui Tao.
2020. "A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging" Sensors 20, no. 9: 2670.
https://doi.org/10.3390/s20092670
APA Style
Xie, Z., Li, Y., Sun, L., Wu, W., Cao, R., & Tao, X.
(2020). A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging. Sensors, 20(9), 2670.
https://doi.org/10.3390/s20092670