Furnari, G.; Vattiato, F.; Allegra, D.; Milotta, F.L.M.; Orofino, A.; Rizzo, R.; De Palo, R.A.; Stanco, F.
An Ensembled Anomaly Detector for Wafer Fault Detection. Sensors 2021, 21, 5465.
https://doi.org/10.3390/s21165465
AMA Style
Furnari G, Vattiato F, Allegra D, Milotta FLM, Orofino A, Rizzo R, De Palo RA, Stanco F.
An Ensembled Anomaly Detector for Wafer Fault Detection. Sensors. 2021; 21(16):5465.
https://doi.org/10.3390/s21165465
Chicago/Turabian Style
Furnari, Giuseppe, Francesco Vattiato, Dario Allegra, Filippo Luigi Maria Milotta, Alessandro Orofino, Rosetta Rizzo, Rosaria Angela De Palo, and Filippo Stanco.
2021. "An Ensembled Anomaly Detector for Wafer Fault Detection" Sensors 21, no. 16: 5465.
https://doi.org/10.3390/s21165465
APA Style
Furnari, G., Vattiato, F., Allegra, D., Milotta, F. L. M., Orofino, A., Rizzo, R., De Palo, R. A., & Stanco, F.
(2021). An Ensembled Anomaly Detector for Wafer Fault Detection. Sensors, 21(16), 5465.
https://doi.org/10.3390/s21165465