Mulugeta, B.A.; Wang, S.; Ben Chikha, W.; Liu, J.; Roblin, C.; Wiart, J.
Statistical Characterization and Modeling of Indoor RF-EMF Down-Link Exposure. Sensors 2023, 23, 3583.
https://doi.org/10.3390/s23073583
AMA Style
Mulugeta BA, Wang S, Ben Chikha W, Liu J, Roblin C, Wiart J.
Statistical Characterization and Modeling of Indoor RF-EMF Down-Link Exposure. Sensors. 2023; 23(7):3583.
https://doi.org/10.3390/s23073583
Chicago/Turabian Style
Mulugeta, Biruk Ashenafi, Shanshan Wang, Wassim Ben Chikha, Jiang Liu, Christophe Roblin, and Joe Wiart.
2023. "Statistical Characterization and Modeling of Indoor RF-EMF Down-Link Exposure" Sensors 23, no. 7: 3583.
https://doi.org/10.3390/s23073583
APA Style
Mulugeta, B. A., Wang, S., Ben Chikha, W., Liu, J., Roblin, C., & Wiart, J.
(2023). Statistical Characterization and Modeling of Indoor RF-EMF Down-Link Exposure. Sensors, 23(7), 3583.
https://doi.org/10.3390/s23073583