Yeager, J.D.; Kuettner, L.A.; Duque, A.L.; Hill, L.G.; Patterson, B.M.
Microcomputed X-Ray Tomographic Imaging and Image Processing for Microstructural Characterization of Explosives. Materials 2020, 13, 4517.
https://doi.org/10.3390/ma13204517
AMA Style
Yeager JD, Kuettner LA, Duque AL, Hill LG, Patterson BM.
Microcomputed X-Ray Tomographic Imaging and Image Processing for Microstructural Characterization of Explosives. Materials. 2020; 13(20):4517.
https://doi.org/10.3390/ma13204517
Chicago/Turabian Style
Yeager, John D., Lindsey A. Kuettner, Amanda L. Duque, Larry G. Hill, and Brian M. Patterson.
2020. "Microcomputed X-Ray Tomographic Imaging and Image Processing for Microstructural Characterization of Explosives" Materials 13, no. 20: 4517.
https://doi.org/10.3390/ma13204517
APA Style
Yeager, J. D., Kuettner, L. A., Duque, A. L., Hill, L. G., & Patterson, B. M.
(2020). Microcomputed X-Ray Tomographic Imaging and Image Processing for Microstructural Characterization of Explosives. Materials, 13(20), 4517.
https://doi.org/10.3390/ma13204517