Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps
Abstract
:1. Introduction
2. Experimental Section
3. Results and Discussion
Elements | Before heat treatment (wt.%) | After 600 °C heat treatment (wt.%) |
---|---|---|
In | 91.2 | 91.6 |
Sn | 8.8 | 8.4 |
4. Conclusions
Acknowledgments
Author Contributions
Conflicts of Interest
References
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Choi, D.; Hong, S.-J.; Son, Y. Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps. Materials 2014, 7, 7662-7669. https://doi.org/10.3390/ma7127662
Choi D, Hong S-J, Son Y. Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps. Materials. 2014; 7(12):7662-7669. https://doi.org/10.3390/ma7127662
Chicago/Turabian StyleChoi, Dongchul, Sung-Jei Hong, and Yongkeun Son. 2014. "Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps" Materials 7, no. 12: 7662-7669. https://doi.org/10.3390/ma7127662
APA StyleChoi, D., Hong, S. -J., & Son, Y. (2014). Characteristics of Indium Tin Oxide (ITO) Nanoparticles Recovered by Lift-off Method from TFT-LCD Panel Scraps. Materials, 7(12), 7662-7669. https://doi.org/10.3390/ma7127662