Zhao, Y.; Potgieter, A.B.; Zhang, M.; Wu, B.; Hammer, G.L.
Predicting Wheat Yield at the Field Scale by Combining High-Resolution Sentinel-2 Satellite Imagery and Crop Modelling. Remote Sens. 2020, 12, 1024.
https://doi.org/10.3390/rs12061024
AMA Style
Zhao Y, Potgieter AB, Zhang M, Wu B, Hammer GL.
Predicting Wheat Yield at the Field Scale by Combining High-Resolution Sentinel-2 Satellite Imagery and Crop Modelling. Remote Sensing. 2020; 12(6):1024.
https://doi.org/10.3390/rs12061024
Chicago/Turabian Style
Zhao, Yan, Andries B Potgieter, Miao Zhang, Bingfang Wu, and Graeme L Hammer.
2020. "Predicting Wheat Yield at the Field Scale by Combining High-Resolution Sentinel-2 Satellite Imagery and Crop Modelling" Remote Sensing 12, no. 6: 1024.
https://doi.org/10.3390/rs12061024
APA Style
Zhao, Y., Potgieter, A. B., Zhang, M., Wu, B., & Hammer, G. L.
(2020). Predicting Wheat Yield at the Field Scale by Combining High-Resolution Sentinel-2 Satellite Imagery and Crop Modelling. Remote Sensing, 12(6), 1024.
https://doi.org/10.3390/rs12061024