Van Beek, J.; Tits, L.; Somers, B.; Deckers, T.; Verjans, W.; Bylemans, D.; Janssens, P.; Coppin, P.
Temporal Dependency of Yield and Quality Estimation through Spectral Vegetation Indices in Pear Orchards. Remote Sens. 2015, 7, 9886-9903.
https://doi.org/10.3390/rs70809886
AMA Style
Van Beek J, Tits L, Somers B, Deckers T, Verjans W, Bylemans D, Janssens P, Coppin P.
Temporal Dependency of Yield and Quality Estimation through Spectral Vegetation Indices in Pear Orchards. Remote Sensing. 2015; 7(8):9886-9903.
https://doi.org/10.3390/rs70809886
Chicago/Turabian Style
Van Beek, Jonathan, Laurent Tits, Ben Somers, Tom Deckers, Wim Verjans, Dany Bylemans, Pieter Janssens, and Pol Coppin.
2015. "Temporal Dependency of Yield and Quality Estimation through Spectral Vegetation Indices in Pear Orchards" Remote Sensing 7, no. 8: 9886-9903.
https://doi.org/10.3390/rs70809886
APA Style
Van Beek, J., Tits, L., Somers, B., Deckers, T., Verjans, W., Bylemans, D., Janssens, P., & Coppin, P.
(2015). Temporal Dependency of Yield and Quality Estimation through Spectral Vegetation Indices in Pear Orchards. Remote Sensing, 7(8), 9886-9903.
https://doi.org/10.3390/rs70809886