Teuschel, M.; Heyes, P.; Horvath, S.; Novotny, C.; Rusconi Clerici, A.
Temperature Stable Piezoelectric Imprint of Epitaxial Grown PZT for Zero-Bias Driving MEMS Actuator Operation. Micromachines 2022, 13, 1705.
https://doi.org/10.3390/mi13101705
AMA Style
Teuschel M, Heyes P, Horvath S, Novotny C, Rusconi Clerici A.
Temperature Stable Piezoelectric Imprint of Epitaxial Grown PZT for Zero-Bias Driving MEMS Actuator Operation. Micromachines. 2022; 13(10):1705.
https://doi.org/10.3390/mi13101705
Chicago/Turabian Style
Teuschel, Marco, Paul Heyes, Samu Horvath, Christian Novotny, and Andrea Rusconi Clerici.
2022. "Temperature Stable Piezoelectric Imprint of Epitaxial Grown PZT for Zero-Bias Driving MEMS Actuator Operation" Micromachines 13, no. 10: 1705.
https://doi.org/10.3390/mi13101705
APA Style
Teuschel, M., Heyes, P., Horvath, S., Novotny, C., & Rusconi Clerici, A.
(2022). Temperature Stable Piezoelectric Imprint of Epitaxial Grown PZT for Zero-Bias Driving MEMS Actuator Operation. Micromachines, 13(10), 1705.
https://doi.org/10.3390/mi13101705