Vahidi, H.; Syed, K.; Guo, H.; Wang, X.; Wardini, J.L.; Martinez, J.; Bowman, W.J.
A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy. Crystals 2021, 11, 878.
https://doi.org/10.3390/cryst11080878
AMA Style
Vahidi H, Syed K, Guo H, Wang X, Wardini JL, Martinez J, Bowman WJ.
A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy. Crystals. 2021; 11(8):878.
https://doi.org/10.3390/cryst11080878
Chicago/Turabian Style
Vahidi, Hasti, Komal Syed, Huiming Guo, Xin Wang, Jenna Laurice Wardini, Jenny Martinez, and William John Bowman.
2021. "A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy" Crystals 11, no. 8: 878.
https://doi.org/10.3390/cryst11080878
APA Style
Vahidi, H., Syed, K., Guo, H., Wang, X., Wardini, J. L., Martinez, J., & Bowman, W. J.
(2021). A Review of Grain Boundary and Heterointerface Characterization in Polycrystalline Oxides by (Scanning) Transmission Electron Microscopy. Crystals, 11(8), 878.
https://doi.org/10.3390/cryst11080878