Order Article Reprints

Yamaguchi T, Sasaki T, Fujikawa S, Takahasi M, Araki T, Onuma T, Honda T, Nanishi Y. In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN. Crystals. 2019; 9(12):631. https://doi.org/10.3390/cryst9120631

Yamaguchi, Tomohiro, Takuo Sasaki, Seiji Fujikawa, Masamitu Takahasi, Tsutomu Araki, Takeyoshi Onuma, Tohru Honda, and Yasushi Nanishi. 2019. "In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN" Crystals 9, no. 12: 631. https://doi.org/10.3390/cryst9120631

Yamaguchi, T., Sasaki, T., Fujikawa, S., Takahasi, M., Araki, T., Onuma, T., Honda, T., & Nanishi, Y. (2019). In Situ Synchrotron X-ray Diffraction Reciprocal Space Mapping Measurements in the RF-MBE Growth of GaInN on GaN and InN. Crystals, 9(12), 631. https://doi.org/10.3390/cryst9120631