Liu, T.; Xu, Z.; Rommel, M.; Wang, H.; Song, Y.; Wang, Y.; Fang, F.
Raman Characterization of Carrier Concentrations of Al-implanted 4H-SiC with Low Carrier Concentration by Photo-Generated Carrier Effect. Crystals 2019, 9, 428.
https://doi.org/10.3390/cryst9080428
AMA Style
Liu T, Xu Z, Rommel M, Wang H, Song Y, Wang Y, Fang F.
Raman Characterization of Carrier Concentrations of Al-implanted 4H-SiC with Low Carrier Concentration by Photo-Generated Carrier Effect. Crystals. 2019; 9(8):428.
https://doi.org/10.3390/cryst9080428
Chicago/Turabian Style
Liu, Tao, Zongwei Xu, Mathias Rommel, Hong Wang, Ying Song, Yufang Wang, and Fengzhou Fang.
2019. "Raman Characterization of Carrier Concentrations of Al-implanted 4H-SiC with Low Carrier Concentration by Photo-Generated Carrier Effect" Crystals 9, no. 8: 428.
https://doi.org/10.3390/cryst9080428
APA Style
Liu, T., Xu, Z., Rommel, M., Wang, H., Song, Y., Wang, Y., & Fang, F.
(2019). Raman Characterization of Carrier Concentrations of Al-implanted 4H-SiC with Low Carrier Concentration by Photo-Generated Carrier Effect. Crystals, 9(8), 428.
https://doi.org/10.3390/cryst9080428